Jack Glover, physicist with Theiss Research and NIST (National Institute of Standards and Technology), in Gaithersburg, Maryland, USA, has received the Award of Excellence from ASTM International Committee on Security Systems and Equipment (F12).
The committee recognized Glover for his accomplishments in developing a new standard practice for evaluating the imaging performance of security x-ray systems (F792), providing the testing that ensures the efficacy of these systems and increasing the public safety.
Glover, a physicist with Theiss Research, has also served as a guest researcher with NIST since 2009. He holds a Ph.D. in Physics from the University of Melbourne in Australia. In addition to ASTM International, Glover is a member of the International Radiation Physics Society and the International Association of Bomb Technicians and Investigators.
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February 10, 2017