ASTM International Committee E04 on Metallography has presented Dr. John J. Friel, lecturer at Temple University in Philadelphia, Pa., with the ASTM Award of Merit and accompanying title of fellow. The Award of Merit is the highest organizational recognition for individual contributions to ASTM standards activities.
Friel was cited "for outstanding contributions in advancing the standardization of materials characterization by electron optical and X-ray techniques and leadership in Committee E04 on Metallography."
A member of ASTM International since 1984, Friel is active in multiple E04 subcommittees and serves as chair of Subcommittee E04.11 on X-Ray and Electron Metallography. He has contributed to the development of many E04 standards related to materials characterization by metallography and was recognized with an Award of Appreciation in 1993 and the L.L. Wyman Award in 2004. In addition to his work on E04, he also serves on Committees C28 on Advanced Ceramics and E42 on Surface Analysis.
Friel began his professional career in 1977 at Bethlehem Steel Corp., Bethlehem, Pa., where he held the position of supervisor, atmospheric corrosion and coatings. He then spent nearly 20 years as technical director at Princeton Gamma-Tech Instruments, Princeton, N.J., before joining the faculty at Temple University in 2007. He is the author of more than 75 publications and one patent.
Outside of ASTM International, Friel is a member of the Microbeam Analysis Society and the Microscopy Society of America. A graduate of the University of Pennsylvania where he earned both a B.S. in natural science and his Ph.D. in geology, Friel also holds an M.A. in geology from Temple University.